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Workshop on ADVANCEMENT IN CHARACTERIZATION TECHNIQUES

Workshop on ADVANCEMENT IN CHARACTERIZATION TECHNIQUES

Scanning Electron Microscopy (SEM) and X-Ray Diffraction (XRD) are basic characterization tools for all kinds of applied research. These techniques have been widely employed for developing frontier materials in the field of Micro-Electro-Mechanical System, Renewable Energy, Nanodevices, Bio-Medical, and Fuel Cells etc. SEM and XRD method also plays a vital […]

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