{"version":"1.0","provider_name":"CARE College of Engineering","provider_url":"https:\/\/care.ac.in\/engineering","author_name":"ecedept","author_url":"https:\/\/care.ac.in\/engineering\/author\/ecedept\/","title":"Guest Lecture \u201cASIC Design &amp; Design for Testability\u201d - CARE College of Engineering","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"00T58ES5A5\"><a href=\"https:\/\/care.ac.in\/engineering\/2023\/11\/05\/22191\/\">Guest Lecture \u201cASIC Design &amp; Design for Testability\u201d<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/care.ac.in\/engineering\/2023\/11\/05\/22191\/embed\/#?secret=00T58ES5A5\" width=\"600\" height=\"338\" title=\"&#8220;Guest Lecture \u201cASIC Design &amp; Design for Testability\u201d&#8221; &#8212; CARE College of Engineering\" data-secret=\"00T58ES5A5\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/* ]]> *\/\n<\/script>\n","thumbnail_url":"https:\/\/care.ac.in\/engineering\/wp-content\/uploads\/sites\/7\/2023\/11\/VLSI-Guest-Lecture-scaled.jpg","thumbnail_width":2560,"thumbnail_height":2560,"description":"\u201cDesign-for-Testability (DFT) is a critical element in the design of modern, high-performance digital systems.\u201d \u2013 Jacob A. Abramovici, electrical engineer and computer scientist, and author of the book Digital Systems Testing and Testable Design. \u201cThe cheapest, fastest, and most reliable components are those that aren&#8217;t there\u201d \u2013 Dr. V.Nithish Kumar, Associate Professor Grade I, Vellore [&hellip;]"}