Workshop on ADVANCEMENT IN CHARACTERIZATION TECHNIQUES

Scanning Electron Microscopy (SEM) and X-Ray Diffraction (XRD) are basic characterization tools for all kinds of applied research. These techniques have been widely employed for developing frontier materials in the field of Micro-Electro-Mechanical System, Renewable Energy, Nanodevices, Bio-Medical, and Fuel Cells etc. SEM and XRD method also plays a vital role in industries. Especially, it has been employed as important tool to solve quality control, failure analysis and R&D problems. So, it’s important to stimulate the students, researchers, young faculties and industrialists for understanding the basics of XRD and SEM to elucidate the structural phenomenon of materials.

Departent of Materials Science and Engineering is going to organize a Workshop on ADVANCEMENT IN CHARACTERIZATION TECHNIQUES on  20 & 21st February, 2017

Click Here for Brochure: Characterization workshop 2016

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